Semiconductors are ubiquitous throughout modern life, and sputtering targets are an early link in the chain of production for semiconductors. Throughout the creation process, statistical analysis is used to drive new development, limit waste, and ensure quality performance. This presentation will cover the basics of sputtering target creation and the role that mathematics and statistical analysis play in the manufacturing process, sharing a somewhat esoteric part of the process for those who may be interested in pursuing it in the future.
Michael Lewandowski, a quality assurance statistician at Tosoh SMD, Inc. will be visiting our campus to share this presentation on the manufacturing applications of statistics. Join us on Monday, November 7, from 3:10 to 4 p.m. in Hayes 109. We hope to see you then!